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Single-layer Graphene on SiO2/Si(n-doped) 1″x1″

Price: $250

Lead time: In Stock

QA Data:
Multipoint Raman spectra included on CD ROM

Typical Raman spectrum of a single layer film Transferred on SiO2/Si

Explanation of Raman spectrum

  1. Raman spectroscopy is used to check the presence of a D peak in graphene samples. If a D peak is present, then this can indicate defects in the sample, such as cracks or flaking.
  2. The ratio of the heights of the 2D peak and the G peak indicate the number of graphene layers.
    2D>G : Single-layer
    2D=G : Double layer
    2D<G : more than triple layer
  3. 3 measurements for every sample are taken and presented on the same graph.

Specification of a SiO2/Si

Material : Single crystal silicon (CZ)

Orientation : (100)

Type/Dopant : n/phosphoric

Resistivity : <50 ohm-cm

Wafer Size : 4 inch (100mm +/- 0.5 mm)

Thickness : 525 micron +/- 25 micron

Oxide Thickness: 1000aa (100nm)

Front Surface: Polished

(Representative Value)

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