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Multipoint Raman spectra included on CD ROM
Typical Raman spectrum of a Multilayer film Transferred on SiO2/Si
Explanation of Raman spectrum
- Raman spectroscopy is used to check the presence of a D peak in graphene samples. If a D peak is present, then this can indicate defects in the sample, such as cracks or flaking.
- The ratio of the heights of the 2D peak and the G peak indicate the number of graphene layers.
2D>G : Single-layer
2D=G : Double layer
2D<G : more than triple layer
- 3 measurements for every sample are taken and presented on the same graph.
Specification of a SiO2/Si
Material : Single crystal silicon (CZ)
Orientation : ï¼100)
Type/Dopant : P/Boron
Resistivity : <50 ohm-cm
Wafer Size : 4 inch (100mm +/- 0.5 mm)
Thickness : 525 micron +/- 25 micron
Oxide Thickness: 1000aa (100nm)
Front Surface: Polished